Title of article :
High-reflection multilayer for wavelength range of 200–30 nm
Author/Authors :
Kondo، نويسنده , , Y. and Ejima، نويسنده , , T. and Saito، نويسنده , , K. and Hatano، نويسنده , , T. and Watanabe، نويسنده , , M.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
4
From page :
333
To page :
336
Abstract :
Composite multilayers consisting of a top single layer and piled double layers with high reflectance through a 200–30 nm wavelength range have been designed and fabricated for normal incidence optical systems and the performance was checked in a 140–30 nm range. The normal incidence reflectance of SiC (top layer)–Y2O3/Mg (double layers) multilayer was more than 14% in a range of 40–30 nm which is much higher than those of W, and 20–40% above 50 nm which is comparable with that of W. The reflectance of SiC (top layer)–Mg/SiC (double layers) multilayer was a little lower than those values.
Keywords :
Multilayer , Reflection coating , Normal incidence , Reflectance , Vacuum ultraviolet
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
2001
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
2191792
Link To Document :
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