Title of article :
Spatial characterization of monolithic multi-element Silicon-Drift-Detectors for X-ray spectroscopic applications
Author/Authors :
Kappen، نويسنده , , P. and Trِger، نويسنده , , L. and Hansen، نويسنده , , K. and Reckleben، نويسنده , , Ch. and Lechner، نويسنده , , P. and Strüder، نويسنده , , L. and Materlik، نويسنده , , G.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Abstract :
Spatially resolved spectroscopic measurements with a 10 and 20 μm pencil beam have been performed on a monolithic 7-element Silicon-Drift-Detector (SDD). Detailed studies are shown of the modification of the spectroscopic response at pixel edges and pixel centre. The results give quantitative insight into the local SDD performance. A simple model predicts global properties (e.g. peak-to-background ratio) of larger SDD arrays, like the 61-element detector currently under development.
Keywords :
Local performance , Peak to background ratio , X-ray spectroscopy , Silicon-drift-detector , Detector characterization , Multi-element
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
