Title of article
Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG
Author/Authors
Dragicevic، نويسنده , , M. and Auzinger، نويسنده , , David G. and Bartl، نويسنده , , U. and Bergauer، نويسنده , , T. and Gamerith، نويسنده , , S. and Hacker، نويسنده , , J. and Kِnig، نويسنده , , A. and Krِner، نويسنده , , F. and Kucher، نويسنده , , E. and Moser، نويسنده , , J. and Neidhart، نويسنده , , T. and Schulze، نويسنده , , A. and Schustereder، نويسنده , , W. and Treberspurg، نويسنده , , W. and Wübben، نويسنده , , T.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2014
Pages
6
From page
1
To page
6
Abstract
Most modern particle physics experiments use silicon based sensors for their tracking systems. These sensors are able to detect particles generated in high energy collisions with high spatial resolution and therefore allow the precise reconstruction of particle tracks. So far only a few vendors were capable of producing silicon strip sensors with the quality needed in particle physics experiments. Together with the European-based semiconductor manufacturer Infineon Technologies AG (Infineon) the Institute of High Energy Physics of the Austrian Academy of Sciences (HEPHY) developed planar silicon strip sensors in p-on-n technology. This work presents the first results from a beam test of strip sensors manufactured by Infineon.
Keywords
Silicon sensor , Planar strip sensor , P-on-n , Semiconductor production
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2014
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2196488
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