Investigation of photon detection probability dependence of SPADnet-I digital photon counter as a function of angle of incidence, wavelength and polarization

SPADnet-I is a prototype, fully digital, high spatial and temporal resolution silicon photon counter, based on standard CMOS imaging technology, developed by the SPADnet consortium. Being a novel device, the exact dependence of photon detection probability (PDP) of SPADnet-I was not known as a function of angle of incidence, wavelength and polarization of the incident light. Our targeted application area of this sensor is next generation PET detector modules, where they will be used along with LYSO:Ce scintillators. Hence, we performed an extended investigation of PDP in a wide range of angle of incidence (0° to 80°), concentrating onto a 60 nm broad wavelength interval around the characteristic emission peak (λ=420 nm) of the scintillator. In the case where the sensor was optically coupled to a scintillator, our experiments showed a notable dependence of PDP on angle, polarization and wavelength. The sensor has an average PDP of approximately 30% from 0° to 60° angle of incidence, where it starts to drop rapidly. The PDP turned out not to be polarization dependent below 30°. If the sensor is used without a scintillator (i.e. the light source is in air), the polarization dependence is much less expressed, it begins only from 50°.