X-ray generation by inverse Compton scattering at the superconducting RF test facility

Quasi-monochromatic X-rays with high brightness have a broad range of applications in fields such as life sciences, bio-, medical applications, and microlithography. One method for generating such X-rays is via inverse Compton scattering (ICS). X-ray generation experiments using ICS were carried out at the superconducting RF test facility (STF) accelerator at KEK. A new beam line, newly developed four-mirror optical cavity system, and new X-ray detector system were prepared for experiments downstream section of the STF electron accelerator. Amplified pulsed photons were accumulated into a four-mirror optical cavity and collided with an incoming 40 MeV electron beam. The generated X-rays were detected using a microchannel plate (MCP) detector for X-ray yield measurements and a new silicon-on-insulator (SOI) detector system for energy measurements. The detected X-ray yield by the MCP detector was 1756.8±272.2 photons/(244 electron bunches). To extrapolate this result to 1 ms train length under 5 Hz operations, 4.60×105 photons/1%-bandwidth were obtained. The peak X-ray energy, which was confirmed by the SOI detector, was 29 keV, and this is consistent with ICS X-rays.