Title of article
Single event effects measurements on the electronics for the CMS muon barrel detector at LHC
Author/Authors
Agosteo، نويسنده , , S and Castellani، نويسنده , , L and DʹAngelo، نويسنده , , G and Dal Corso، نويسنده , , F and Dallavalle، نويسنده , , G.M and De Giorgi، نويسنده , , M and Fernandez، نويسنده , , C and Gonella، نويسنده , , F and Lippi، نويسنده , , I and Marin، نويسنده , , J and Martinelli، نويسنده , , R and Montanari، نويسنده , , A and Odorici، نويسنده , , F and Oller، نويسنده , , J.C and Pegoraro، نويسنده , , M and Torromeo، نويسنده , , G and Travaglini، نويسنده , , R and Verlato، نويسنده , , M and Willmott، نويسنده , , C and Zotto، نويسنده , , P، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
13
From page
357
To page
369
Abstract
Several irradiation tests of the electronics of the CMS barrel muon detector were performed using neutrons, protons and heavy ions. The Single Event Upset rate on some tested devices was measured, while upper limits were obtained for devices having experienced no failure. Single Event Transients on front-end electronics and destructive effects on the High-voltage distribution electronics were observed. Overcurrent protection and error correction circuits were included in the irradiated boards and were tested.
Keywords
SEU , Single event upsets , Single Event Effects , Radiation tolerance
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2002
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2197207
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