Title of article
White beam Laue topography using a scintillator-CCD combination
Author/Authors
Yi، نويسنده , , J.M. and Seol، نويسنده , , S.K. and Je، نويسنده , , J.H. and Argunova، نويسنده , , T.S. and Hwu، نويسنده , , Y. and Tsai، نويسنده , , W.-L.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
5
From page
152
To page
156
Abstract
Using a scintillator-CCD imaging system, we successfully conducted a synchrotron white beam Laue topography (WBLT) experiment. It is demonstrated that this approach is able to provide a high-resolution microtopograph of p/p+ Si (1 0 0). Optimum condition for high-resolution imaging is obtainable from the incident angle dependence of geometrical resolution. Black and white dislocation contrast suggests the potential of WBLT in characterizing dislocation structure.
Keywords
Dislocation , X-ray diffraction , X-ray topography
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2005
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2199277
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