Title of article :
Applying X-rays in material analysis
Author/Authors :
Kogan، نويسنده , , Vladimir and Bethke، نويسنده , , Klaus and Vries، نويسنده , , Roelof de، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
This paper presents some applications of X-ray diffraction analysis for the development and quality control of modern semiconductor detectors.
Keywords :
Semiconductor materials , X-ray diffraction , quality control , Thin films
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
