Lifetime determination in delayed-coincidence experiments using the differential decay-curve approach

A new method for the analysis of delayed-coincidence lifetime experiments is proposed following the approach of the Differential decay-curve method. Examples of application of the procedure using simulated and experimental data reveal its reliability for lifetimes in the nanosecond and sub-nanosecond range. The procedure is expected to improve the treatment of systematic errors and scarce data. Possible further expansions and practical aspects of the procedure are also discussed.