Position-sensitive detector system OBI for High Resolution X-Ray Powder Diffraction using on-site readable image plates

A one-dimensional detector system has been developed using image plates. The detector is working in transmission mode or Debye–Scherrer geometry and is on-site readable which reduces the effort for calibration. It covers a wide angular range up to 110° and shows narrow reflection half-widths depending on the capillary diameter. The acquisition time is in the range of minutes and the data quality allows for reliable Rietveld refinement of complicated structures, even in multi-phase samples. The detector opens a wide field of new applications in kinetics and temperature resolved measurements.