Title of article
Degradation of SiGe HBT with reactor pulse neutron and gamma rays irradiation
Author/Authors
Liu، نويسنده , , Shu-huan and Lin، نويسنده , , Dong-sheng and Guo، نويسنده , , Xiaoqiang and Liu، نويسنده , , Nannan and Jiang، نويسنده , , Xin-biao and Zhu، نويسنده , , Guang-ning and Li، نويسنده , , Da and Wang، نويسنده , , Zhu-jun and Tang، نويسنده , , Ben-qi and Chen، نويسنده , , Wei and Zhang، نويسنده , , Wei and Zhou، نويسنده , , Hui and Shao، نويسنده , , Beibei and Li، نويسنده , , Jun-li، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
5
From page
810
To page
814
Abstract
The typical dc electronic parameters degradation of SiGe HBT irradiated by reactor pulse neutron and gamma rays were measured. The mechanisms of transient radiation-induced damage in SiGe HBT were preliminary analyzed.
Keywords
Pulse reactor , Radiation damage , SiGe HBT
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2006
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2202388
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