Title of article
Radiation tests of CMS RPC muon trigger electronic components
Author/Authors
Bu?kowski، نويسنده , , Karol and Kassamakov، نويسنده , , Ivan and Kr?likowski، نويسنده , , Jan and Kierzkowski، نويسنده , , Krzysztof and Kud?a، نويسنده , , Maciej and Maenpaa، نويسنده , , Teppo and Po?niak، نويسنده , , Krzysztof and Rybka، نويسنده , , Dominik and Tuominen، نويسنده , , Eija and Ungaro، نويسنده , , Donatella and Wrochna، نويسنده , , Grzegorz and Zabo?otny، نويسنده , , Wojciech، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
10
From page
708
To page
717
Abstract
The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were also investigated, but not observed. For the FLASH memories no single upsets were detected. Only after irradiating with a huge dose permanent damages of devices were observed. For Synchronous Dynamic Random Access Memory (SDRAM), the SEU cross-section was measured.
Keywords
SDRAM , SRAM , FLASH , SEU , radiation , FPGA
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2005
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2203109
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