Precise measurement of hydrogen content in thin films using multilayer spin splitter

The results of neutron reflectometry on measuring hydrogen content in a Pd thin film are presented and a new method of detecting hydrogen content in a thin film of hydrogen absorbing material is proposed. By neutron reflectometry, hydrogen content H/Pd in a 40 nm-thick Pd film is obtained as 0.42 at the surface and as 0.69 at the substrate under 0.02 MPa hydrogen pressure. In addition to the above results, we propose a new method for measuring hydrogen content in a thin film using multilayer spin splitters, which enables us to apply neutron phase-spin echo technique. In the new method, precision of hydrogen content can be improved.