EBIC and IBIC Imaging on Polycrystalline CdTe

Polycrystalline Cadmium Telluride samples were electrically characterized using two high resolution imaging techniques: Electron and Ion Beam Induced Current. Using different probes, electrons and protons, both surface and bulk transport properties were obtained. The grain structure was observed and grain boundaries effects were studied. The material tends to have a homogeneous response under low excitation, with only few weakly responding grains and no dead areas. Under higher excitation, the material exhibits some particular behavior, like grain sub-structures. The IBIC experiment gives a measure of Charge Collection Efficiency under different sample bias voltages. In addition to the measurement of the response dispersion, it leads to a discussion of the charge transport properties and a mobility-lifetime product calculation.