Title of article
Polarimetric performance of Si/CdTe semiconductor Compton camera
Author/Authors
Takeda، نويسنده , , Shin’ichiro and Odaka، نويسنده , , Hirokazu and Katsuta، نويسنده , , Junichiro and Ishikawa، نويسنده , , Shin-nosuke and Sugimoto، نويسنده , , So-ichiro and Koseki، نويسنده , , Yuu and Watanabe، نويسنده , , Shin-ichiro Sato، نويسنده , , Goro and Kokubun، نويسنده , , Motohide and Takahashi، نويسنده , , Tadayuki and Nakazawa، نويسنده , , Kazuhiro and Fukazawa، نويسنده , , Yasushi a، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2010
Pages
9
From page
619
To page
627
Abstract
A Compton camera has been developed based on Si and CdTe semiconductor detectors with high spatial and spectral resolution for hard X- and γ ‐ray astrophysics applications. A semiconductor Compton camera is also an excellent polarimeter due to its capability to precisely measure the Compton scattering azimuth angle, which is modulated by linear polarization. We assembled a prototype Compton camera and conducted a beam test using nearly 100% linearly polarized γ ‐ rays at SPring-8.
Keywords
Gamma-ray astronomy , Compton camera , Polarimeter
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2010
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2206854
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