Title of article :
Spectroscopic silicon imaging detectors: Past achievements and new developments
Author/Authors :
Lutz، نويسنده , , G. and Andritschke، نويسنده , , R. and Andricek، نويسنده , , David L. and Eckhardt، نويسنده , , R. and Englhauser، نويسنده , , J. G. Fuchs، نويسنده , , G. and Hنlker، نويسنده , , O. N. Hartmann، نويسنده , , R. and Heinzinger، نويسنده , , Antonios K. and Hermann، نويسنده , , S. and Holl، نويسنده , , Richard P. and Kimmel، نويسنده , , N. and Lechner، نويسنده , , P. and Meidinger، نويسنده , , N. and Porro، نويسنده , , M. and Richter، نويسنده , , R.H. and Schaller، نويسنده , , G. and Schnecke، نويسنده , , M. and Schopper، نويسنده , , F. and Soltau، نويسنده , , H. and Strüder، نويسنده , , L. and Treis، نويسنده , , J. and Weichert، نويسنده , , U. and Wِlfl، نويسنده , , S.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
8
From page :
960
To page :
967
Abstract :
The need of high quality spectroscopic semiconductor imaging detectors in X-ray astronomy was the principal driving force in founding the MPI Semiconductor Laboratory. Detectors developed in this laboratory are based on new function principles and are processed in the silicon detector processing line established within the laboratory. We describe the development of pnCCDs as already used in the XMM-Newton European X-ray observatory and foreseen for eROSITA, the DEPFET based pixel detector for XEUS and a new development which makes it possible to measure charge with a precision below one elementary charge. A noise value of 0.25 electron r.m.s. has already been reached.
Keywords :
RNDR , XEUS , XMM , Silicon detector , Pixel detector , Imaging , Spectroscopy , DEPFET
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
2007
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
2207795
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=2207795
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