Title of article
Characterization of TlBr for X-ray and γ-ray detector applications
Author/Authors
Kostamo، نويسنده , , P. and Shorohov، نويسنده , , M. and Gostilo، نويسنده , , V. and Sipilن، نويسنده , , H. and Kozlov، نويسنده , , V. and Lisitsky، نويسنده , , I. and Kuznetsov، نويسنده , , M. and Lankinen، نويسنده , , A. and Danilewsky، نويسنده , , A.N. and Lipsanen، نويسنده , , H. and Leskelن، نويسنده , , M.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2009
Pages
3
From page
129
To page
131
Abstract
Crystal quality of radiation detector-grade TlBr material was analyzed by X-ray diffraction and synchrotron X-ray topography methods. The analyzed TlBr crystals were further processed for electrical characterization and current–voltage characteristics were measured at a temperature range of 210–320 K. The crystals studied in this work were grown by the Bridgman–Stockbarger process. X-ray diffraction measurements show the presence of small-angle grain boundaries in the crystals. The crystal with the most pronounced small-angle boundaries showed the lowest resistivity and the poorest spectroscopic characteristics.
Keywords
?-ray detector , X-ray detector , TlBr , X-ray topography
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2009
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2209989
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