Title of article :
Synchrotron-based photoelectron microscopy
Author/Authors :
Barinov، نويسنده , , Alexei and Dudin، نويسنده , , Pavel and Gregoratti، نويسنده , , Luca and Locatelli، نويسنده , , Andrea and Onur Mente?، نويسنده , , Tevfik and ?ngel Ni?o، نويسنده , , Miquel and Kiskinova، نويسنده , , Maya، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Abstract :
The paper is a brief overview of the operation principles and the potentials of the scanning photoelectron microscopes (SPEM) and X-ray photoemission electron microscopes (XPEEM) operating at synchrotron facilities. Selected results will illustrate the impact of high spatial resolution for micro-characterization of the surface composition and electronic structure, a key issue for analysis of technologically relevant materials and for fundamental understanding of many unexplored surface phenomena.
Keywords :
Interfaces , Nanostructures , X-ray photoemission electron microscopy , surfaces , surface reactions , Scanning photoelectron microscopy
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
