Planning sequential constant-stress accelerated life tests with stepwise loaded auxiliary acceleration factor

This article presents a design approach for sequential constant-stress accelerated life tests (ALT) with an auxiliary acceleration factor (AAF). The use of an AAF, if it exists, is to further amplify the failure probability of highly reliability testing items at low stress levels while maintaining an acceptable degree of extrapolation for reliability inference. Based on a Bayesian design criterion, the optimal plan optimizes the sample allocation, stress combination, as well as the loading profile of the AAF. In particular, a step-stress loading profile based on an appropriate cumulative exposure (CE) model is chosen for the AAF such that the initial auxiliary stress will not be too harsh. A case study, providing the motivation and practical importance of our study, is presented to illustrate the proposed planning approach.