Title of article :
Strength analysis of clamping in micro/nano scale experiments
Author/Authors :
Liu، نويسنده , , Liang and Zeng، نويسنده , , Dujuan and Wei، نويسنده , , XianLong and Chen، نويسنده , , Qing and Li، نويسنده , , Xide، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
9
From page :
584
To page :
592
Abstract :
Two kinds of clamping in micro/nano scale experiments are investigated in this paper, one based on electron-beam-induced deposition, and the other on the van der Waals interaction. The clamping strength and mechanism are analyzed both theoretically and experimentally. The inuence of relative humidity on the micro/nano clamping and the method of electrostatic clamping are discussed. The clamping strength and performance of different clamping methods are compared considering the size and material of the clamped objects, and the application environments.
Keywords :
micro/nano experimental mechanics , Clamping , electron-beam-induced deposition (EBID) , interfacial strength , cohesive zone model
Journal title :
Acta Mechanica Solida Sinica
Serial Year :
2009
Journal title :
Acta Mechanica Solida Sinica
Record number :
2227931
Link To Document :
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