• Title of article

    Strength analysis of clamping in micro/nano scale experiments

  • Author/Authors

    Liu، نويسنده , , Liang and Zeng، نويسنده , , Dujuan and Wei، نويسنده , , XianLong and Chen، نويسنده , , Qing and Li، نويسنده , , Xide، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2009
  • Pages
    9
  • From page
    584
  • To page
    592
  • Abstract
    Two kinds of clamping in micro/nano scale experiments are investigated in this paper, one based on electron-beam-induced deposition, and the other on the van der Waals interaction. The clamping strength and mechanism are analyzed both theoretically and experimentally. The inuence of relative humidity on the micro/nano clamping and the method of electrostatic clamping are discussed. The clamping strength and performance of different clamping methods are compared considering the size and material of the clamped objects, and the application environments.
  • Keywords
    micro/nano experimental mechanics , Clamping , electron-beam-induced deposition (EBID) , interfacial strength , cohesive zone model
  • Journal title
    Acta Mechanica Solida Sinica
  • Serial Year
    2009
  • Journal title
    Acta Mechanica Solida Sinica
  • Record number

    2227931