• Title of article

    Economic Reliability Test Plans using the Generalized Exponential Distribution

  • Author/Authors

    ASLAM، M. نويسنده , , Qaisar Shahbaz2، Muhammad نويسنده ,

  • Issue Information
    سالنامه با شماره پیاپی سال 2007
  • Pages
    8
  • From page
    53
  • To page
    60
  • Abstract
    Economic Reliability Test Plans (ERTP) are developed assuming that the life time follows the Generalized Exponential Distribution (GED). For a given termination number, sample size and producer’s risk waiting time to terminate the experiment are computed. Comparisons of these reliability plans have been made with reliability plans of the Log-Logistic Distribution (Kantam et al., 2006). On the basis of the Kolmogorov-Smirnov test for both distributions it is found that the reliability plans obtained from GED are more economic in saving cost, energy and time. The results are explained with the help of tables and examples.
  • Keywords
    Life Tests , Generalized exponential distribution , Reliability Test Plans , Log-logistic distributions
  • Journal title
    Journal of Statistics
  • Serial Year
    2007
  • Journal title
    Journal of Statistics
  • Record number

    225634