Title of article
Measurement of Oxide Thickness on Al-10%Si and Al-10%Si–.05%Li Alloys by TEM and Electron Microprobe
Author/Authors
Shaarbaf، نويسنده , , Mortaza، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
6
From page
279
To page
284
Journal title
Materials Characterization
Serial Year
1999
Journal title
Materials Characterization
Record number
2265805
Link To Document