مرکز منطقه ای اطلاع رساني علوم و فناوري - Measurement of Oxide Thickness on Al-10%Si and Al-10%Si–.05%Li Alloys by TEM and Electron Microprobe

Title of article :

Measurement of Oxide Thickness on Al-10%Si and Al-10%Si–.05%Li Alloys by TEM and Electron Microprobe

Author/Authors :

Shaarbaf، نويسنده , , Mortaza، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1999

Pages :

From page :

279

To page :

284

Journal title :

Materials Characterization

Serial Year :

1999

Journal title :

Materials Characterization

Record number :

2265805

Link To Document :