Title of article
Characterization of mullite/ZrO2 toughness ceramic materials microstructure by medium voltage analytical electron microscopy
Author/Authors
Rincَn، نويسنده , , Jesْs Ma. and Romero، نويسنده , , Maximina، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
7
From page
117
To page
123
Abstract
A series of mullite/ZrO2 and mullite/alumina/ZrO2 high-toughness ceramic materials have been examined by analytical electron microscopy (AEM) at 300 kV and by using the following techniques: energy dispersive X-ray (EDX) microanalysis, microdiffraction and convergent beam electron diffraction (CBED). The relative advantages and disadvantages for the analysis at higher voltages on the investigation of advanced ceramics are compared with results obtained at 120 kV.
Keywords
ceramics , Medium voltage analytical electron microscopy , Mullite , Zirconia , TEM/EDX
Journal title
Materials Characterization
Serial Year
2000
Journal title
Materials Characterization
Record number
2265837
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