Title of article :
Be diffusion in GaN
Author/Authors :
Chang، نويسنده , , S.J. and Lai، نويسنده , , W.C. and Chen، نويسنده , , J.F. and Chen، نويسنده , , Kevin S.C. and Huang، نويسنده , , B.R. and Liu، نويسنده , , C.H. and Liaw، نويسنده , , U.H.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
5
From page :
337
To page :
341
Abstract :
Beryllium (Be)-diffused GaN samples have been successfully fabricated by depositing Ni/AuBe onto p-GaN and subsequent thermal annealing. It was found that Be atoms can diffuse much faster than Ni atoms. The Be diffusion length is about 0.5 μm for a sample thermally annealed for 5 min at 650 °C. It was also found that although the room temperature photoluminescence (PL) spectra are the same for the Be-diffused samples annealed at different temperatures, low-temperature PL spectra are significantly different for samples annealed at different temperatures. For the sample annealed at 650 °C, a large PL blue shift was observed when the PL measurement temperature was decreased from room temperature to 10 K.
Keywords :
GaN , Pl , diffusion , SIMS , BE
Journal title :
Materials Characterization
Serial Year :
2002
Journal title :
Materials Characterization
Record number :
2266009
Link To Document :
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