A new method to evaluate the quality of single crystal Cu by an X-ray diffraction butterfly pattern method

A new method for the evaluation of the quality of an Ohno continuous cast (OCC) Cu single crystal by X-ray diffraction (XRD) butterfly pattern was brought forward. Experimental results show that the growth direction of single crystal Cu is inclined from both sides of the single crystal Cu rod to the axis and is axially symmetric. The degree of deviation from the [100] orientation from the crystal axis is less than 5° with a casting speed 10–40 mm/min. The orientation of single crystal Cu does not have a fixed direction but is in a regular range. Moreover, the orientation of stray grains in the single crystal Cu is random from continuous casting.