Title of article :
A cross-sectional TEM sample preparation method for films deposited on metallic substrates
Author/Authors :
Liu، نويسنده , , Yan and Wang، نويسنده , , Ruobin and Guo، نويسنده , , Xinqiu and Dai، نويسنده , , Jiawei، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Abstract :
This paper concerns the method on how to prepare TEM samples for the films deposited on metallic substrates. This method is described in a step-by-step way and applied to the VN/SiO2 superlattice to testify to its feasibility in the second part.
Keywords :
Superlattice film , films , Cross-sectional TEM sample preparation , Metallic substrate
Journal title :
Materials Characterization
Journal title :
Materials Characterization
