Title of article
Structural characterization of REMgNi4 type compounds
Author/Authors
Wang، نويسنده , , Z.M. and Ni، نويسنده , , Chengyuan and Zhou، نويسنده , , Huaiying and Yao، نويسنده , , Qingrong، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
5
From page
422
To page
426
Abstract
A series of REMgNi4 (RE = La, Ce, Pr, Nd, Y), La1−xNdxMgNi4 (x = 0.1–1.0) and LaMgNi4−y (y = 0.1–0.4) compounds have been prepared and characterized via X-ray diffraction (XRD). The lattice constant (a) and cell volume (V) of the REMgNi4 phase in these compounds were calculated with Si as the internal standard at 298 K. These results indicate that an apparent translation from the LaMgNi4 phase to the NdMgNi4 phase was observed with an increase of x from 0.1 to 1.0 in single-phase La1−xNdxMgNi4 compounds, while non-stoichiometric LaMgNi4−y (y = 0.1–0.4) compounds maintain their original single-phase structure, though the increase of the lattice constant (a) of the LaMgNi4 phase has been observed with an increase of y.
Keywords
REMgNi4 , lattice constant , La1?xNdxMgNi4 , LaMgNi4?y
Journal title
Materials Characterization
Serial Year
2008
Journal title
Materials Characterization
Record number
2266758
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