Probing Systems in Dimensional Metrology

Dimensional parameters are the most commonly encountered quality characteristics of workpieces. The measuring process for testing conformance of those characteristics contains the important sub-process of probing the surface. A huge variety of probing systems for performing different measurement tasks on the shop floor, as well as in the metrological environment, have been developed. In coordinate measuring machines (CMM) probing systems must ensure reproducibility of the sensing operation even in the sub-micrometer range. This paper describes requirements, different principles and characteristics of tactile probing systems in dimensional metrology, with examples of several probing systems that are used in practice.