Title of article :
Miniaturized Optical Measurement Methods for Surface Nanometrology
Author/Authors :
Jiang، نويسنده , , X. and Whitehouse، نويسنده , , D.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
4
From page :
577
To page :
580
Abstract :
This paper introduces some new types of optical surface measurement methods. One method uses spatial light-wave scanning to replace mechanical stylus scanning, and an optical fibre interferometer to replace optically bulky interferometers either of which are involved in almost all current surface measurement (stylus and optical) methods. The optical principle is based on measuring the phase shift of light reflected from the surface by using a combination of Wavelength/Frequency-Division-Multiplexing (WDM or FDM) and Fibre Bragg Grating (FBG) techniques. The WDM/FDM-FBG techniques provide the implementation of phase-to-depth and wavelength-to-field detection, and can offer a large dynamic measurement ratio (range/resolution) with a high signal-to-noise ratio (robustness).
Keywords :
optical , surface , Measurement
Journal title :
CIRP Annals - Manufacturing Technology
Serial Year :
2006
Journal title :
CIRP Annals - Manufacturing Technology
Record number :
2267594
Link To Document :
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