Title of article :
The effect of carbon on surface quality of solid-state-sintered silicon carbide as optical materials
Author/Authors :
Chen، نويسنده , , Jian and Huang، نويسنده , , Zhengren and Chen، نويسنده , , Zhongming and Yuan، نويسنده , , Ming and Liu، نويسنده , , Yan and Zhu، نويسنده , , Yunzhou، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2014
Pages :
6
From page :
7
To page :
12
Abstract :
The microstructure and the distribution of carbon (C) in silicon carbide (SiC) ceramics were investigated by scanning electron microscopy and transmission electron microscopy. The results show that C can restrain the growth of SiC grains and densify SiC ceramics with the increase of the C content, but residual C introduces a new phase-C to SiC ceramics. The hardness of C is less than that of SiC, so itʹs difficult to be polished as optical materials. The existence of C phase doesnʹt lead to the increase of surface roughness on SiC optical materials, but it leads to the decrease of the reflectance of SiC as the optical materials because the optical absorption of C in visible light is stronger than that of SiC. It indicates that C content is very important to the surface properties of SiC, which will affect the coating of chemical vapor deposition SiC or Si on the surface of SiC ceramics because of the different physical and chemical properties between C and SiC.
Keywords :
Surface roughness , Reflectance , optical materials , carbon , silicon carbide
Journal title :
Materials Characterization
Serial Year :
2014
Journal title :
Materials Characterization
Record number :
2269274
Link To Document :
بازگشت