Title of article
Triple ion beam cutting of diamond/Al composites for interface characterization
Author/Authors
Ji، نويسنده , , Gang and Tan، نويسنده , , Zhanqiu and Shabadi، نويسنده , , Rajashekhara and Li، نويسنده , , Zhiqiang and Grünewald، نويسنده , , Wolfgang and Addad، نويسنده , , Ahmed and Schryvers، نويسنده , , Dominique and Zhang، نويسنده , , Di، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2014
Pages
6
From page
132
To page
137
Abstract
A novel triple ion beam cutting technique was employed to prepare high-quality surfaces of diamond/Al composites for interfacial characterization, which has been unachievable so far. Near-perfect and artifact-free surfaces were obtained without mechanical pre-polishing. Hence, the as-prepared surfaces are readily available for further study and also, ready to be employed in a focus ion beam system for preferential selection of transmission electron microscopy samples. Dramatically different diamond/Al interface configurations — sub-micrometer Al2O3 particles and clean interfaces were unambiguously revealed.
Keywords
Diamond/Al composite , Metal Matrix composites , Triple ion beam cutting , Interface characterization , Electron microscopy
Journal title
Materials Characterization
Serial Year
2014
Journal title
Materials Characterization
Record number
2269306
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