• Title of article

    In situ real-time measurement for micro-structured surfaces

  • Author/Authors

    Jiang، نويسنده , , X.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2011
  • Pages
    4
  • From page
    563
  • To page
    566
  • Abstract
    A fundamentally improved technology for micro structured surface measurement, based on Wavelength Division Multiplexing (WDM) and Graphics Processing Unit (GPU) techniques is introduced. The WDM technique allows phase-to-depth implementation over large measurement ratios (range/resolution) while the GPU technique allows the analysis of the optical interferograms in real-time. This research attempts to create a new kind of full-field measurement to replace electro-mechanical scanning with white-light interferometry and to form a compact system that is fast, robust and suitable for in situ surface measurement. An experimental system has been developed for the manufacture of diamond turned/fly cut micro-structured surfaces on a large drum diamond turning machine (DTM).
  • Keywords
    Structured surfaces , In situ measurement , Optical interferometry
  • Journal title
    CIRP Annals - Manufacturing Technology
  • Serial Year
    2011
  • Journal title
    CIRP Annals - Manufacturing Technology
  • Record number

    2269359