Title of article :
In situ real-time measurement for micro-structured surfaces
Author/Authors :
Jiang، نويسنده , , X.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2011
Pages :
4
From page :
563
To page :
566
Abstract :
A fundamentally improved technology for micro structured surface measurement, based on Wavelength Division Multiplexing (WDM) and Graphics Processing Unit (GPU) techniques is introduced. The WDM technique allows phase-to-depth implementation over large measurement ratios (range/resolution) while the GPU technique allows the analysis of the optical interferograms in real-time. This research attempts to create a new kind of full-field measurement to replace electro-mechanical scanning with white-light interferometry and to form a compact system that is fast, robust and suitable for in situ surface measurement. An experimental system has been developed for the manufacture of diamond turned/fly cut micro-structured surfaces on a large drum diamond turning machine (DTM).
Keywords :
Structured surfaces , In situ measurement , Optical interferometry
Journal title :
CIRP Annals - Manufacturing Technology
Serial Year :
2011
Journal title :
CIRP Annals - Manufacturing Technology
Record number :
2269359
Link To Document :
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