Title of article :
Microstructure evolution during annealing of TiAl/NiCoCrAl multilayer composite prepared by EB-PVD
Author/Authors :
Zhang، نويسنده , , Rubing and Zhang، نويسنده , , Deming and Chen، نويسنده , , Guiqing and Wang، نويسنده , , Yuesheng، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2014
Pages :
8
From page :
32
To page :
39
Abstract :
TiAl/NiCoCrAl laminate composite sheet with a thickness of 0.4–0.6 mm as well as a dimension of 150 mm × 100 mm was fabricated successfully by using electron beam physical vapor deposition (EB-PVD) method. The annealing treatment was processed at 1123 and 1323 K for 3 h in a high vacuum atmosphere, respectively. The phase composition and microstructure of TiAl/NiCoCrAl microlaminated sheet have been analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM) and transmission electron microscopy (TEM). Based on the sheet characterization and results of the microstructure evolution during annealing treatment process, the diffusion mechanism of interfacial reaction in TiAl/NiCoCrAl microlaminate was investigated and discussed.
Keywords :
Transmission electron microscopy , Vapor deposition , diffusion , microstructure , Scanning electron microscopy
Journal title :
Materials Characterization
Serial Year :
2014
Journal title :
Materials Characterization
Record number :
2269440
Link To Document :
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