Title of article :
Nano fabrication of star structure for precision metrology developed by focused ion beam direct writing
Author/Authors :
Xu، نويسنده , , Zongwei and Fang، نويسنده , , Fengzhou and Gao، نويسنده , , Haifeng and Zhu، نويسنده , , Yibo and Wu، نويسنده , , Wei and Weckenmann، نويسنده , , Albert، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2012
Pages :
4
From page :
511
To page :
514
Abstract :
The optimized design and nano fabrication of the star structures with continuous-variation spoke width are investigated in this study. Focused ion beam direct writing (FIBDW) technology is employed to fabricate the stars on various materials with an application-oriented design. The star center dimension and surface finish are minimized. The star structures with spokeʹs width ranging from 25 nm to 16 μm and step height from 1 nm to 1 μm are achieved precisely. optical microscopy, scanning probe microscopy and scanning electronic microscopy are used to test their measurement capabilities based on the developed star structures in lateral and longitudinal directions, respectively.
Keywords :
Metrology , Ion beam machining (IBM) , Interferometry
Journal title :
CIRP Annals - Manufacturing Technology
Serial Year :
2012
Journal title :
CIRP Annals - Manufacturing Technology
Record number :
2269641
Link To Document :
بازگشت