Title of article
A method to correct coordinate distortion in EBSD maps
Author/Authors
Zhang، نويسنده , , Y.B. and Elbrّnd، نويسنده , , A. and Lin، نويسنده , , F.X.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2014
Pages
8
From page
158
To page
165
Abstract
Drift during electron backscatter diffraction mapping leads to coordinate distortions in resulting orientation maps, which affects, in some cases significantly, the accuracy of analysis. A method, thin plate spline, is introduced and tested to correct such coordinate distortions in the maps after the electron backscatter diffraction measurements. The accuracy of the correction as well as theoretical and practical aspects of using the thin plate spline method is discussed in detail. By comparing with other correction methods, it is shown that the thin plate spline method is most efficient to correct different local distortions in the electron backscatter diffraction maps.
Keywords
Transmission electron microscopy (TEM) , Recrystallization , Thin plate spline (TPS) , Electron channeling contrast (ECC) , electron backscatter diffraction (EBSD)
Journal title
Materials Characterization
Serial Year
2014
Journal title
Materials Characterization
Record number
2269652
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