• Title of article

    A method to correct coordinate distortion in EBSD maps

  • Author/Authors

    Zhang، نويسنده , , Y.B. and Elbrّnd، نويسنده , , A. and Lin، نويسنده , , F.X.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2014
  • Pages
    8
  • From page
    158
  • To page
    165
  • Abstract
    Drift during electron backscatter diffraction mapping leads to coordinate distortions in resulting orientation maps, which affects, in some cases significantly, the accuracy of analysis. A method, thin plate spline, is introduced and tested to correct such coordinate distortions in the maps after the electron backscatter diffraction measurements. The accuracy of the correction as well as theoretical and practical aspects of using the thin plate spline method is discussed in detail. By comparing with other correction methods, it is shown that the thin plate spline method is most efficient to correct different local distortions in the electron backscatter diffraction maps.
  • Keywords
    Transmission electron microscopy (TEM) , Recrystallization , Thin plate spline (TPS) , Electron channeling contrast (ECC) , electron backscatter diffraction (EBSD)
  • Journal title
    Materials Characterization
  • Serial Year
    2014
  • Journal title
    Materials Characterization
  • Record number

    2269652