Title of article :
Microstructural, chemical and textural characterization of ZnO nanorods synthesized by aerosol assisted chemical vapor deposition
Author/Authors :
Sلenz-Trevizo، نويسنده , , A. and Amézaga-Madrid، نويسنده , , P. and Fuentes-Cobas، نويسنده , , L. and Pizل-Ruiz، نويسنده , , P. and Antْnez-Flores، نويسنده , , W. and Ornelas-Gutiérrez، نويسنده , , C. and Pérez-Garcيa، نويسنده , , S.A. and Miki-Yoshida، نويسنده , , M.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2014
Abstract :
ZnO nanorods were synthesized by aerosol assisted chemical vapor deposition onto TiO2 covered borosilicate glass substrates. Deposition parameters were optimized and kept constant. Solely the effect of different nozzle velocities on the growth of ZnO nanorods was evaluated in order to develop a dense and uniform structure. The crystalline structure was characterized by conventional X-ray diffraction in grazing incidence and Bragg–Brentano configurations. In addition, two-dimensional grazing incidence synchrotron radiation diffraction was employed to determine the preferred growth direction of the nanorods. Morphology and growth characteristics analyzed by electron microscopy were correlated with diffraction outcomes. Chemical composition was established by X-ray photoelectron spectroscopy. X-ray diffraction results and X-ray photoelectron spectroscopy showed the presence of wurtzite ZnO and anatase TiO2 phases. Morphological changes noticed when the deposition velocity was lowered to the minimum, indicated the formation of relatively vertically oriented nanorods evenly distributed onto the TiO2 buffer film. By coupling two-dimensional X-ray diffraction and computational modeling with ANAELU it was proved that a successful texture determination was achieved and confirmed by scanning electron microscopy analysis. Texture analysis led to the conclusion of a preferred growth direction in [001] having a distribution width Ω = 20° ± 2°.
Keywords :
2D X-ray diffraction , Texture determination , ZnO nanorods , ANAELU software , Electron microscopy
Journal title :
Materials Characterization
Journal title :
Materials Characterization