Title of article
Dispersed reference interferometry
Author/Authors
Martin، نويسنده , , Haydn and Jiang، نويسنده , , Xiangqian، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2013
Pages
4
From page
551
To page
554
Abstract
Dispersed reference interferometry (DRI) is a potentially useful technique for applications such as absolute displacement, surface topography and film thickness measurement. A bulk optic implementation of a short coherence dispersed reference interferometer is described with the chromatic dispersion applied using two matched transmission gratings in one arm. Such an interferometer can provide absolute knowledge of position by tracking a symmetrical fringe pattern produced by a spectrometer. An operating principle is presented and validation provided through empirical data from optical apparatus. We present experimental results for the resolution, linearity and repeatability of the investigated interferometer apparatus.
Keywords
Interferometry , measuring instrument , DIMENSIONAL , surface
Journal title
CIRP Annals - Manufacturing Technology
Serial Year
2013
Journal title
CIRP Annals - Manufacturing Technology
Record number
2269963
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