Title of article
A Transmission-Electron-Microscopy Study of the Substructure of High-Purity Pearlite
Author/Authors
Eric M and Bramfitt، نويسنده , , B.L and Marder، نويسنده , , A.R، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
9
From page
199
To page
207
Abstract
Using transmission electron microscopy, many of the substructural faults of pearlite colonies were identified and characterized. It was found that a ferrite subgrain boundary can affect the growth of a cementite lamella depending upon the orientation of the boundary with respect to the growth direction of the lamella. Other substructural features found were: dislocations at the cementite-ferrite interface, discontinuities in cementite lamellae containing a high density of dislocations, and growth steps in cementite lamellae. The observed phenomena are discussed in terms of the origin of dislocations and substructural faults in a growing pearlite colony.
Journal title
Materials Characterization
Serial Year
1997
Journal title
Materials Characterization
Record number
2270303
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