Title of article
FTIR studies of tungsten carbide in bulk material and thin film samples
Author/Authors
Hoffmann، نويسنده , , P and Galindo، نويسنده , , H and Zambrano، نويسنده , , G and Rincَn، نويسنده , , C and Prieto، نويسنده , , P، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
5
From page
255
To page
259
Abstract
The use of Fourier transform infrared (FTIR) spectroscopy is proposed to characterize thin films of tungsten carbide (WC) coatings. For this reason, the IR reflection spectrum of a bulk sample was recorded and used as a reference. Three infrared bands were observed. They are located at 1067,1144, and 1220 cm−1. They were assigned to hexagonal and cubic phases of WC. These assignments are supported by XRD measurements. These results were used to characterize different WC films deposited on stainless steel substrates.
Keywords
Hard Coatings , FTIR , Infrared , tungsten carbide
Journal title
Materials Characterization
Serial Year
2003
Journal title
Materials Characterization
Record number
2270509
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