Title of article
CoFIS and TELog: New downhole tools for characterizing dispersion processes in aquifers by single-well injection-withdrawal tracer tests
Author/Authors
Gouze، نويسنده , , Philippe and Leprovost، نويسنده , , Richard and Poidras، نويسنده , , Thierry and Le Borgne، نويسنده , , Tanguy and Lods، نويسنده , , Gérard and Pezard، نويسنده , , Philippe A.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2009
Pages
11
From page
965
To page
975
Abstract
Contaminant migration in aquifers is one of the most debated issues in hydrogeology, as most experimental results display large deviations from the standard (asymptotic) Fickian dispersion theories. Multi-scale investigation and high-resolution sensors are required to determine the origin of non-asymptotic dispersion and validate models. For this, a set of multi-scale Single-Well Injection-Withdrawal (SWIW) tracer tests using a new dual-packer probe CoFIS, including a high resolution optical sensor TELog, are presented. When compared to standard techniques such as salinity measurements, it is shown that high-resolution optical measurements allow an improved characterization of the long-lasting non-asymptotic dispersion mechanisms.
Keywords
dispersion , dispersion , Single-well injection-withdrawal tracer tests , Dual-packer probe , Fluorescent optical sensors , Non-Fickian behaviour , Traçage en mode écho , Sonde double-obturateur , Capteurs optiques de fluorescence , Comportement non Fickien
Journal title
Comptes Rendus Geoscience
Serial Year
2009
Journal title
Comptes Rendus Geoscience
Record number
2280982
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