Title of article :
Laser diode reliability: crystal defects and degradation modes
Author/Authors :
Jiménez، نويسنده , , Juan، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
11
From page :
663
To page :
673
Abstract :
Degradation analysis is a crucial issue for the improvement of high power laser diodes. Degradation occurs in three different modes: rapid, gradual and catastrophic. It can be located inside the cavity or at the facet mirrors. Each type of degradation presents its own signature and different crystal defects appear associated with them. The main physical mechanisms responsible for laser degradation are analysed showing the relation between the main degradation modes and the different materials properties of the laser structures. To cite this article: J. Jiménez, C. R. Physique 4 (2003).
Keywords :
Degradation , Dislocation climb , Dislocation glide , Recombinaison , dégradation , Catastrophic degradation , Dark line defects , Dark spot defects , Recombination enhanced defect reaction , Dégradation catastrophique , Défauts lignes noires , Défauts points noirs , Montée de dislocations , Glissement de dislocations
Journal title :
Comptes Rendus Physique
Serial Year :
2003
Journal title :
Comptes Rendus Physique
Record number :
2283252
Link To Document :
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