Title of article :
Measuring colloidal forces using evanescent wave scattering
Author/Authors :
Bike، نويسنده , , Stacy G، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
The evanescent wave scattering technique total internal reflection microscopy has enabled the direct measurement of the mean potential energy of interaction between a Brownian particle and a flat surface. With a distance resolution of 1 nm and a force resolution of 10 fN, this technique has successfully measured a variety of colloidal forces. Recent measurements of van der Waals interactions have given rise to new theories for the effect of surface roughness on the interaction. In addition, recent measurements of depletion interactions have shown that energetic as well as entropic effects must be considered when computing the interaction potential.
Keywords :
Total internal reflection microscopy (TIRM) , Evanescent wave light scattering microscopy (EVLSM) , Colloidal forces , Depletion forces , van der Waals forces , Electrostatic forces , radiation pressure
Journal title :
Current Opinion in Colloid and Interface Science
Journal title :
Current Opinion in Colloid and Interface Science