Title of article
Measuring colloidal forces using evanescent wave scattering
Author/Authors
Bike، نويسنده , , Stacy G، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
7
From page
144
To page
150
Abstract
The evanescent wave scattering technique total internal reflection microscopy has enabled the direct measurement of the mean potential energy of interaction between a Brownian particle and a flat surface. With a distance resolution of 1 nm and a force resolution of 10 fN, this technique has successfully measured a variety of colloidal forces. Recent measurements of van der Waals interactions have given rise to new theories for the effect of surface roughness on the interaction. In addition, recent measurements of depletion interactions have shown that energetic as well as entropic effects must be considered when computing the interaction potential.
Keywords
Total internal reflection microscopy (TIRM) , Evanescent wave light scattering microscopy (EVLSM) , Colloidal forces , Depletion forces , van der Waals forces , Electrostatic forces , radiation pressure
Journal title
Current Opinion in Colloid and Interface Science
Serial Year
2000
Journal title
Current Opinion in Colloid and Interface Science
Record number
2304836
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