Title of article
Thin liquid films studied by atomic force microscopy
Author/Authors
Bonaccurso، نويسنده , , Elmar and Kappl، نويسنده , , Michael and Butt، نويسنده , , Hans-Jürgen، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
13
From page
107
To page
119
Abstract
Since its invention twenty years ago the atomic force microscope (AFM) has become one of the most important instruments in colloid and interface science. The ability of tracing force profiles between single particles or particles and flats in liquid environment makes it a tool-of-choice for investigating thin liquid films. In this paper we review experimental work on confined Newtonian and non-Newtonian liquids using the AFM.
Keywords
atomic force microscopy , Colloidal Probe Technique , Liquid film drainage , Solvation force , Hydrodynamic force , Hydration force , Depletion force , Deformable surfaces
Journal title
Current Opinion in Colloid and Interface Science
Serial Year
2008
Journal title
Current Opinion in Colloid and Interface Science
Record number
2305494
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