Title of article :
Thin liquid films studied by atomic force microscopy
Author/Authors :
Bonaccurso، نويسنده , , Elmar and Kappl، نويسنده , , Michael and Butt، نويسنده , , Hans-Jürgen، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
13
From page :
107
To page :
119
Abstract :
Since its invention twenty years ago the atomic force microscope (AFM) has become one of the most important instruments in colloid and interface science. The ability of tracing force profiles between single particles or particles and flats in liquid environment makes it a tool-of-choice for investigating thin liquid films. In this paper we review experimental work on confined Newtonian and non-Newtonian liquids using the AFM.
Keywords :
atomic force microscopy , Colloidal Probe Technique , Liquid film drainage , Solvation force , Hydrodynamic force , Hydration force , Depletion force , Deformable surfaces
Journal title :
Current Opinion in Colloid and Interface Science
Serial Year :
2008
Journal title :
Current Opinion in Colloid and Interface Science
Record number :
2305494
Link To Document :
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