Title of article :
Effect of ion exchange on strength and slow crack growth of a dental porcelain
Author/Authors :
Rosa، نويسنده , , Vinicius and Yoshimura، نويسنده , , Humberto N. and Pinto، نويسنده , , Marcelo M. and Fredericci، نويسنده , , Catia and Cesar، نويسنده , , Paulo F.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
8
From page :
736
To page :
743
Abstract :
Objectives ermine the effect of ion exchange on slow crack growth (SCG) parameters (n, stress corrosion susceptibility coefficient, and σf0, scaling parameter) and Weibull parameters (m, Weibull modulus, and σ0, characteristic strength) of a dental porcelain. s rcelain discs were fabricated according to manufacturerʹs instructions, polished through 1 μm and divided into two groups: GC (control) and GI (submitted to an ion exchange procedure using a KNO3 paste at 470 °C for 15 min). SCG parameters were determined by biaxial flexural strength test in artificial saliva at 37 °C using five constant stress rates (n = 10). 20 specimens of each group were tested at 1 MPa/s to determine Weibull parameters. The SPT diagram was constructed using the least-squares fit of the strength data versus probability of failure. s alues of m and σ0 (95% confidence interval), n and σf0 (standard deviation) were, respectively: 13.8 (10.1 − 18.8) and 60.4 (58.5 − 62.2), 24.1 (2.5) and 58.1 (0.01) for GC and 7.4 (5.3 − 10.0) and 136.8 (129.1 − 144.7), 36.7 (7.3) and 127.9 (0.01) for GI. Fracture stresses (MPa) calculated using the SPT diagram for lifetimes of 1 day, 1 year and 10 years (at a 5% failure probability) were, respectively, 31.8, 24.9 and 22.7 for GC and 71.2, 60.6 and 56.9 for GI. icance e porcelain tested, the ion exchange process improved strength and resistance to SCG, however, the materialʹs reliability decreased. The predicted fracture stress at 5% failure probability for a lifetime of 10 years was also higher for the ion treated group.
Keywords :
Saliva , Ion exchange , Strength , Slow crack growth , Dental porcelain
Journal title :
Defence Technology
Serial Year :
2009
Journal title :
Defence Technology
Record number :
2317064
Link To Document :
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