Title of article :
Effects of solvent evaporation time on immediate adhesive properties of universal adhesives to dentin
Author/Authors :
Luque-Martinez، نويسنده , , Issis V. and Perdigمo، نويسنده , , Jorge and Muٌoz، نويسنده , , Miguel A. and Sezinando، نويسنده , , Ana and Reis، نويسنده , , Alessandra and Loguercio، نويسنده , , Alessandro D.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2014
Pages :
10
From page :
1126
To page :
1135
Abstract :
AbstractObjective luate the microtensile bond strengths (μTBS) and nanoleakage (NL) of three universal or multi-mode adhesives, applied with increasing solvent evaporation times. s ndred and forty caries-free extracted third molars were divided into 20 groups for bond strength testing, according to three factors: (1) Adhesive – All-Bond Universal (ABU, Bisco, Inc.), Prime&Bond Elect (PBE, Dentsply), and Scotchbond Universal Adhesive (SBU, 3 M ESPE); (2) Bonding strategy – self-etch (SE) or etch-and-rinse (ER); and (3) Adhesive solvent evaporation time – 5 s, 15 s, and 25 s. Two extra groups were prepared with ABU because the respective manufacturer recommends a solvent evaporation time of 10 s. After restorations were constructed, specimens were stored in water (37 °C/24 h). Resin–dentin beams (0.8 mm2) were tested at 0.5 mm/min (μTBS). For NL, forty extracted molars were randomly assigned to each of the 20 groups. Dentin disks were restored, immersed in ammoniacal silver nitrate, sectioned and processed for evaluation under a FESEM in backscattered mode. Data from μTBS were analyzed using two-way ANOVA (adhesive vs. drying time) for each strategy, and Tukeyʹs test (α = 0.05). NL data were computed with non-parametric tests (Kruskal–Wallis and Mann–Whitney tests, α = 0.05). s sing solvent evaporation time from 5 s to 25 s resulted in statistically higher mean μTBS for all adhesives when used in ER mode. Regarding NL, ER resulted in greater NL than SE for each of the evaporation times regardless of the adhesive used. A solvent evaporation time of 25 s resulted in the lowest NL for SBU-ER. icance al water and/or solvent may compromise the performance of universal adhesives, which may be improved with extended evaporation times.
Keywords :
Microtensile bond strength , Etch-and-rinse , Nanoleakage , Self-etch , Dentin , Universal simplified adhesive systems , Solvent evaporation
Journal title :
Dental Materials
Serial Year :
2014
Journal title :
Dental Materials
Record number :
2318799
Link To Document :
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