• Title of article

    Post-stishovite phase boundary in SiO2 determined by in situ X-ray observations

  • Author/Authors

    Ono، نويسنده , , Shigeaki and Hirose، نويسنده , , Kei and Murakami، نويسنده , , Motohiko and Isshiki، نويسنده , , Maiko، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2002
  • Pages
    6
  • From page
    187
  • To page
    192
  • Abstract
    A laser heating diamond anvil cell experiment, with an angle-dispersive X-ray diffraction using synchrotron radiation source at the SPring-8, has been developed to observe the phase transition in silica (SiO2) between the P42/mnm (rutile-type) and Pnnm (CaCl2-type) up to pressures of 100 GPa and at temperatures up to 2200 K. The transition was observed in the vicinity of 55 GPa at room temperature, and showed a positive temperature dependence of the transition pressure. The phase boundary was determined to follow the equation P (GPa)=(51±2)+(0.012±0.005)×T (K). Our result gives a transition pressure of near 80 GPa and a depth of 1900 km at an expected lower mantle temperature of 2000–2500 K. Therefore, this SiO2 transition is not the cause of recent observations of seismic anomalies between 800 and 1600 km depth in the mid–lower mantle.
  • Keywords
    Stishovite , silica
  • Journal title
    Earth and Planetary Science Letters
  • Serial Year
    2002
  • Journal title
    Earth and Planetary Science Letters
  • Record number

    2322281