Non-destructive observation of meteorite chips using quantitative analysis of optimized X-ray micro-computed tomography

A method for the non-destructive observation of extraterrestrial materials using X-ray computed tomography (CT) is discussed. This method allows to image texture of objects in meteorites without destructive methods of sample preparation. Quantitative analysis of X-ray CT data was achieved by measuring X-ray linear attenuation coefficients (LACs). The histogram of the LAC value provides information regarding the meteorite structure, such as the internal components and their chemical composition. The change of the signal-to-noise ratio (S/N ratio) of CT data is investigated by optimizing the CT measurement conditions. These results form an important baseline for the initial analysis of extraterrestrial materials.