• Title of article

    Equilibrium depth and spacing of cracks in a tensile residual stressed thin film deposited on a brittle substrate

  • Author/Authors

    Zhang، نويسنده , , Tong-Yi and Zhao، نويسنده , , Ming-Hao، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2002
  • Pages
    8
  • From page
    589
  • To page
    596
  • Abstract
    The depth and spacing of cracks in a tensile residual stressed thin film bonded on a brittle substrate are analyzed thermodynamically using the minimum energy theorem on the basis that the film has the same mechanical properties as the substrate. The results show that the cracks penetrate into the substrate. Simple and approximate relationships between three dimensionless parameters, i.e., the normalized crack depth and spacing, and the cracking resistance number, are derived, which determine the fracture behavior of the film.
  • Keywords
    Crack , Thin films , Critical thickness
  • Journal title
    ENGINEERING FRACTURE MECHANICS
  • Serial Year
    2002
  • Journal title
    ENGINEERING FRACTURE MECHANICS
  • Record number

    2340070