Title of article
Equilibrium depth and spacing of cracks in a tensile residual stressed thin film deposited on a brittle substrate
Author/Authors
Zhang، نويسنده , , Tong-Yi and Zhao، نويسنده , , Ming-Hao، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
8
From page
589
To page
596
Abstract
The depth and spacing of cracks in a tensile residual stressed thin film bonded on a brittle substrate are analyzed thermodynamically using the minimum energy theorem on the basis that the film has the same mechanical properties as the substrate. The results show that the cracks penetrate into the substrate. Simple and approximate relationships between three dimensionless parameters, i.e., the normalized crack depth and spacing, and the cracking resistance number, are derived, which determine the fracture behavior of the film.
Keywords
Crack , Thin films , Critical thickness
Journal title
ENGINEERING FRACTURE MECHANICS
Serial Year
2002
Journal title
ENGINEERING FRACTURE MECHANICS
Record number
2340070
Link To Document