Application of an optical spectroscopy multichannel analysis detection system as plasma diagnostic tools in the HT-7 and HT-6M tokamaks

A space- and wavelength-resolving spectrometer detection system is described. The system is used to measure spectral line shapes simultaneously along several viewing directions. Annulus fitting techniques are used to reconstruct the local plasma parameters from the line-integrated profiles. The system, with its data fitting, is suitable for diagnosing the plasma boundary and is advantageous in smaller devices with steep gradients.