Magnetic Force Microscopy using fabricated cobalt-coated carbon nanotubes probes

Magnetic force microscope (MFM) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope (AFM) tip was investigated. The optimum voltage and frequency of SWCNT solution are obtained as 13 volts and 2 MHz, respectively. After coating theas-prepared CNT tips with a layer of cobalt,it can be used to obtain high resolution MFM images.